Title :
The test data verifying & prediction model of electrical contact
Author :
Li, Wenhua ; Li, Kui ; Sun, Lijun ; Zhao, Shangwu ; Ji, Lijuan
Author_Institution :
Electr. Apparatus Inst., Hebei Univ. of Technol., Tianjin, China
Abstract :
With the system scale becoming larger and more complex, the influence of the electrical contact on the reliability has been more and more important in modern electric power and control system. In This work, the method of dynamic data analysis that judges the variation trend of contacts´ parameters is introduced. Then we take several methods to simulate and establish the prediction model of contact resistances. By the validation and contrast between measured data and the prediction values, it is concluded that the prediction model based on the method of average and standard error accords with the measured data preferably. The variation of contact resistances may be influenced by many factors. In order to verify the correctness of the variation principle of contact resistances, and the applicability of the established prediction model, we design a set of testing instrument. By using it, we can accurately measure contact resistances under different ambient condition, and know its variation from the test beginning to the final failure. The veracity of failure prediction is directly affected by data and surface microscopic analysis. Thus the further research is continued for the perfection of the prediction model.
Keywords :
contact resistance; data analysis; electrical contacts; failure analysis; relays; reliability; test equipment; variational techniques; contact resistances; control system; dynamic data analysis; electric power; electrical contact prediction model; reliability; standard error method; surface microscopic analysis; test data analysis; testing instrument design; variation principle; Contacts; Control systems; Data analysis; Electrical resistance measurement; Instruments; Measurement standards; Power system modeling; Power system reliability; Predictive models; Testing;
Conference_Titel :
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN :
0-7803-8460-1
DOI :
10.1109/HOLM.2004.1353152