DocumentCode
1843203
Title
Who Pays for Characterization?: The Final Dilemma for MESFET Modeling
Author
Golio, Mike ; Couie, Jim
Author_Institution
Rockwell, Collins Commercial Avionics, Cedar Rapids, IA 52498, (319) 295-3926 m.golio@ieee.org
Volume
30
fYear
1996
fDate
Dec. 1996
Firstpage
87
Lastpage
93
Abstract
A search for validated, accurate device models is often the first step microwave designers take when confronted with a new MMIC design task. Although many proven characterization, parameter extraction and modeling procedures have been published, the designer often finds that none are available for the device of interest and the present application. Despite the fact that acceptable performance predictions have been achieved through a variety of modeling methodologies, few organizations have instituted modeling efforts to develop and archive validated model libraries for the processes they use. This paper identifies cost as the key reason why validated modeling libraries are not more common. It further identifies measurement costs as the major portion of modeling expenses. Approximate quantification of these costs (in terms of man-hours of effort) is also presented.
Keywords
Costs; Impedance measurement; Libraries; MESFETs; Parameter extraction; Predictive models; Pulse measurements; Radio frequency; Scattering parameters; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Fall, 48th
Conference_Location
Clearwater, FL, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1996.327194
Filename
4119876
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