DocumentCode :
1843203
Title :
Who Pays for Characterization?: The Final Dilemma for MESFET Modeling
Author :
Golio, Mike ; Couie, Jim
Author_Institution :
Rockwell, Collins Commercial Avionics, Cedar Rapids, IA 52498, (319) 295-3926 m.golio@ieee.org
Volume :
30
fYear :
1996
fDate :
Dec. 1996
Firstpage :
87
Lastpage :
93
Abstract :
A search for validated, accurate device models is often the first step microwave designers take when confronted with a new MMIC design task. Although many proven characterization, parameter extraction and modeling procedures have been published, the designer often finds that none are available for the device of interest and the present application. Despite the fact that acceptable performance predictions have been achieved through a variety of modeling methodologies, few organizations have instituted modeling efforts to develop and archive validated model libraries for the processes they use. This paper identifies cost as the key reason why validated modeling libraries are not more common. It further identifies measurement costs as the major portion of modeling expenses. Approximate quantification of these costs (in terms of man-hours of effort) is also presented.
Keywords :
Costs; Impedance measurement; Libraries; MESFETs; Parameter extraction; Predictive models; Pulse measurements; Radio frequency; Scattering parameters; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Fall, 48th
Conference_Location :
Clearwater, FL, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1996.327194
Filename :
4119876
Link To Document :
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