• DocumentCode
    1843203
  • Title

    Who Pays for Characterization?: The Final Dilemma for MESFET Modeling

  • Author

    Golio, Mike ; Couie, Jim

  • Author_Institution
    Rockwell, Collins Commercial Avionics, Cedar Rapids, IA 52498, (319) 295-3926 m.golio@ieee.org
  • Volume
    30
  • fYear
    1996
  • fDate
    Dec. 1996
  • Firstpage
    87
  • Lastpage
    93
  • Abstract
    A search for validated, accurate device models is often the first step microwave designers take when confronted with a new MMIC design task. Although many proven characterization, parameter extraction and modeling procedures have been published, the designer often finds that none are available for the device of interest and the present application. Despite the fact that acceptable performance predictions have been achieved through a variety of modeling methodologies, few organizations have instituted modeling efforts to develop and archive validated model libraries for the processes they use. This paper identifies cost as the key reason why validated modeling libraries are not more common. It further identifies measurement costs as the major portion of modeling expenses. Approximate quantification of these costs (in terms of man-hours of effort) is also presented.
  • Keywords
    Costs; Impedance measurement; Libraries; MESFETs; Parameter extraction; Predictive models; Pulse measurements; Radio frequency; Scattering parameters; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 48th
  • Conference_Location
    Clearwater, FL, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1996.327194
  • Filename
    4119876