DocumentCode :
1843230
Title :
SINAD and BER For Production Testing of RFICs
Author :
Roos, Mark
Author_Institution :
Roos Instruments
Volume :
30
fYear :
1996
fDate :
Dec. 1996
Firstpage :
94
Lastpage :
98
Keywords :
Bit error rate; Circuit testing; Distortion measurement; Filters; Noise figure; Noise measurement; Production; Radiofrequency integrated circuits; Signal generators; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Fall, 48th
Conference_Location :
Clearwater, FL, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1996.327195
Filename :
4119877
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1843230
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