DocumentCode :
1843239
Title :
Concerning contact resistance prediction based on time sequence and distribution character
Author :
Yao, Fang ; Li, Zhigang ; Li, Wenhua ; Li, Kui
Author_Institution :
Inst. of Electr. Apparatus, Hebei Univ. of Technol., Tianjin, China
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
447
Lastpage :
452
Abstract :
We take statistics on experimental data, including static contact resistance, bounce time and the max contact resistance of relay´s matching contacts in the dynamic closing process. A conclusion is drawn that the contact resistance is not in obedience to the normal distribution function. The further analysis makes clear that the contact reliability on contacts has correlation with the eigenvalues of diagnostic parameters and the figure of their distribution density curves. The reason for these is discussed preliminarily. On the ground of the above work, we develop the contact resistance prediction model based on time sequence and distribution character.
Keywords :
contact resistance; eigenvalues and eigenfunctions; electrical contacts; normal distribution; relays; reliability theory; statistical analysis; bounce time; contact resistance prediction model; diagnostic parameter; distribution density curves; dynamic closing process; eigenvalues; electrical contact reliability; maximal contact resistance; normal distribution function; relays matching contacts; statistical analysis; statistics eigenvalues; time sequences; Contact resistance; Eigenvalues and eigenfunctions; Gaussian distribution; Instruments; Performance analysis; Predictive models; Relays; Statistical distributions; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN :
0-7803-8460-1
Type :
conf
DOI :
10.1109/HOLM.2004.1353155
Filename :
1353155
Link To Document :
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