Title :
The influence of kinetic parameters on failure mechanisms caused by material transfer
Author :
Neuhaus, Alexander R. ; Felkel, Thomas ; Hammerschmid, Andreas ; Rieder, W.F.
Author_Institution :
ACT Res. GmbH, Wiener Neustadt, Austria
Abstract :
While the physical mechanisms of material transfer have been investigated in detail for seventy years, very little is known about the mechanisms of how material transfer causes switching failures due to interlocking, material loss or gap bridging. Detailed investigations detected how these failure modes are caused by interactions of material transfer and certain kinetic parameters of the switching contacts.
Keywords :
electrical contacts; failure analysis; life testing; failure mechanisms; failure modes; gap bridging; interlocking; kinetic parameters; life testing; material loss; material transfer; switching contacts; switching failures; Bridge circuits; Contacts; Failure analysis; Force measurement; Kinetic theory; Optical materials; Power system economics; Switches; Switching circuits; Voltage;
Conference_Titel :
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN :
0-7803-8460-1
DOI :
10.1109/HOLM.2004.1353167
