High performance data acquisition system for IRFPA testing

Author

Gang, Wang Yong ; Feng, Zheng Yu ; Hui, Zhou Zhong

Author_Institution

Dept. of Modern Phys., Univ. of Sci. & Technol. of China, Hefei

fYear

2008

fDate

18-21 May 2008

Firstpage

2649

Lastpage

2652

Abstract

We describe a VXI-based general-purpose data acquisition system for the characteristic testing of the 3rd generation infrared focal plane array detectors (IRFPA). The system has an option of correlated double sampling mode and normal SHA sampling mode with maximal 12.5 MSPS sampling rate and 16-bit sampling resolution. The sampling points in both modes are adjustable freely in their possible range. Arbitrary clock signals generator can provide clock signals for the testing of IRFPA with a size of 4096times4096 pixels. The system was designed to have good immunity to electrical noise interference and it has a measured dynamic range of 2¹⁴ . A three channel version of this system, each channel has 64 MB memory size, can be used for multi-band IRFPA testing in the future.

Keywords

data acquisition; focal planes; infrared detectors; optical testing; signal generators; 3rd generation infrared focal plane array detectors; IRFPA testing; arbitrary clock signals generator; correlated double sampling mode; data acquisition system; electrical noise interference; normal SHA sampling mode; Character generation; Clocks; Data acquisition; Infrared detectors; Interference; Sampling methods; Sensor arrays; Signal generators; Signal resolution; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on

Conference_Location

Seattle, WA

Print_ISBN

978-1-4244-1683-7

Electronic_ISBN

978-1-4244-1684-4

Type

conf

DOI

10.1109/ISCAS.2008.4542001

Filename

4542001