DocumentCode
1843801
Title
An ion gating strategy for a miniaturized planar Ion Mobility Spectrometer
Author
Chiarot, Paul R ; Sullivan, Pierre ; Ben Mrad, Ridha
Author_Institution
Dept. of Mech. & Ind. Eng., Univ. of Toronto, Toronto, ON, Canada
fYear
2010
fDate
7-10 Nov. 2010
Firstpage
2279
Lastpage
2282
Abstract
In Ion Mobility Spectrometry, the identities of charged species are determined by measuring their mobility in an electric field and comparing the results to an established database. The charged species may be from a toxin, drug, or organic compound. Measurements are made on small packets of ions, since measurements on a continuous stream of ions does not provide drift time information. The performance of an Ion Mobility Spectrometer is largely determined by the effectiveness of the ion gating technique and the ability to emit and block ions from entering the drift region. A miniaturized version of an Ion Mobility Spectrometer is more easily integrated with other microfluidic devices and would be useful in portable applications. However, a customized gating strategy is required that is compatible with the design and fabrication of these miniaturized devices. This work examines a gating strategy and counter-electrode configuration for a `planar-type´ Ion Mobility Spectrometer with an electrospray ionization source. Numerical modeling and device testing confirms the static operation of the proposed strategy. Applications of Ion Mobility Spectrometry are in health care, biotechnology, and security.
Keywords
ion mobility; micromechanical devices; particle spectrometers; spectrochemical analysis; counter-electrode configuration; electric field; electrospray ionization source; ion gating technique; microfluidic devices; miniaturized planar ion mobility spectrometer; organic compound;
fLanguage
English
Publisher
ieee
Conference_Titel
IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
Conference_Location
Glendale, AZ
ISSN
1553-572X
Print_ISBN
978-1-4244-5225-5
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2010.5675099
Filename
5675099
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