• DocumentCode
    1843801
  • Title

    An ion gating strategy for a miniaturized planar Ion Mobility Spectrometer

  • Author

    Chiarot, Paul R ; Sullivan, Pierre ; Ben Mrad, Ridha

  • Author_Institution
    Dept. of Mech. & Ind. Eng., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2010
  • fDate
    7-10 Nov. 2010
  • Firstpage
    2279
  • Lastpage
    2282
  • Abstract
    In Ion Mobility Spectrometry, the identities of charged species are determined by measuring their mobility in an electric field and comparing the results to an established database. The charged species may be from a toxin, drug, or organic compound. Measurements are made on small packets of ions, since measurements on a continuous stream of ions does not provide drift time information. The performance of an Ion Mobility Spectrometer is largely determined by the effectiveness of the ion gating technique and the ability to emit and block ions from entering the drift region. A miniaturized version of an Ion Mobility Spectrometer is more easily integrated with other microfluidic devices and would be useful in portable applications. However, a customized gating strategy is required that is compatible with the design and fabrication of these miniaturized devices. This work examines a gating strategy and counter-electrode configuration for a `planar-type´ Ion Mobility Spectrometer with an electrospray ionization source. Numerical modeling and device testing confirms the static operation of the proposed strategy. Applications of Ion Mobility Spectrometry are in health care, biotechnology, and security.
  • Keywords
    ion mobility; micromechanical devices; particle spectrometers; spectrochemical analysis; counter-electrode configuration; electric field; electrospray ionization source; ion gating technique; microfluidic devices; miniaturized planar ion mobility spectrometer; organic compound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Glendale, AZ
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-5225-5
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2010.5675099
  • Filename
    5675099