Verification of the Noise Parameter Instrumentation

The available gain of a linear two-port device, as a function of a source reflection coefficient, can be characterized by measuring its scattering parameters on a Vector Network Analyzer(VNA). An alternate characterization procedure of the available gain, as a function of a source reflection coefficient, using a noise source and noise figure receiver is presented. By comparing the available gain information derived from two different methods, one can make a judgment in the validity of the noise parameter instrumentation, as long as the VNA measurements are verifiable.