• DocumentCode
    1844088
  • Title

    Non-Invasive Dual-Probe Time Domain Measurements of Incident and Reflected Waves on High-speed Digital Chip Interconnects

  • Author

    Barel, Alain ; Rolain, Yves ; Cumps, Ann

  • Author_Institution
    Dpt ELEC, Vrije Universiteit Brussel, Belgium
  • Volume
    31
  • fYear
    1997
  • fDate
    35582
  • Firstpage
    201
  • Lastpage
    207
  • Abstract
    A dual high frequency probe method is proposed to acquire the incident and reflected waves on the transmission line between two high speed digital chips by use of a sampling scope.
  • Keywords
    Bandwidth; Circuit testing; Frequency; Integrated circuit interconnections; Performance evaluation; Probes; Reflection; Semiconductor device measurement; Time measurement; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 49th
  • Conference_Location
    Denver, CO, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1997.327229
  • Filename
    4119914
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1844088