Title :
An Accurate Determination of the Characteristic Impedance Matrix of Coupled Symmetrical Lines on Chips Baser on High Frequency S-Parameter Measurements
Author :
Winkel, Thomas-Michael ; Dutta, Lohit Sagar ; Grabinski, Hartmut
Author_Institution :
IBM, Schönaicher Str. 220, 71032 Böblingen, Germany
Abstract :
A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
Keywords :
Calibration; Frequency measurement; Impedance measurement; Microwave theory and techniques; Probes; Scattering parameters; Semiconductor device measurement; Silicon; Symmetric matrices; Transmission line matrix methods;
Conference_Titel :
ARFTG Conference Digest-Spring, 49th
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1997.327232
