DocumentCode
1844214
Title
CAD of waveguide structures with production based radii at arbitrary double (E-H) plane steps and junction ports
Author
Reiter, J.M. ; Beyer, R. ; Rosenberg, U.
Author_Institution
Mician GbR, Bremen, Germany
Volume
3
fYear
2002
fDate
2-7 June 2002
Firstpage
2081
Abstract
The introduction of an enhanced Boundary Contour Mode Matching (BCMM) approach is shown to provide accurate and efficient analysis of waveguide structures with curved shapes at double (E-H) plane discontinuities of junctions and steps. Such geometries take account or the capabilities of state-of-the-art CNC milling production techniques, commonly used for integrated waveguide subsystems. The method is based on direct expansion of the electromagnetic fields of the double-plane discontinuities into the modes of the connecting rectangular waveguides and additionally in case of junctions into cylindrical cavity modes. Validation of the approach has been proven by several component designs, that exhibit almost coincidence of computed and measured responses. The results of a special 4-pole filter design at 10 GHz using bypass couplings for a tailored asymmetric response and a 3 dB E-plane short-slot coupler, operating at 32 GHz, are presented as quite different examples.
Keywords
CAD; electrical engineering computing; mode matching; passive filters; rectangular waveguides; waveguide components; waveguide couplers; waveguide discontinuities; waveguide filters; waveguide theory; 10 GHz; 32 GHz; 4-pole filter; CAD; CNC milling production techniques; E-plane short-slot coupler; EM fields; asymmetric response; bypass couplings; cylindrical cavity modes; direct expansion; double plane discontinuities; junction ports; production based radii; rectangular waveguides; steps; waveguide structures; Computer numerical control; Electromagnetic fields; Electromagnetic waveguides; Geometry; Milling; Planar waveguides; Production; Shape; Waveguide discontinuities; Waveguide junctions;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location
Seattle, WA, USA
ISSN
0149-645X
Print_ISBN
0-7803-7239-5
Type
conf
DOI
10.1109/MWSYM.2002.1012279
Filename
1012279
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