• DocumentCode
    1844576
  • Title

    An empirical HBT Large Signal Model for CAD

  • Author

    Angelov, I. ; Choumei, K. ; Inoue, A.

  • Author_Institution
    Microwave Electron. Lab., Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    3
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    2137
  • Abstract
    Extensive measurements were performed at different temperatures on GaAs HBT´s in order to obtain a simple Large Signal Model usable in CAD. The model was experimentally evaluated by DC, S and Power Spectrum measurements and good correspondence was obtained between measurements and experiment.
  • Keywords
    CAD; III-V semiconductors; S-parameters; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; CAD; DC measurements; GaAs; GaAs HBT; S-parameter measurements; large-signal model; power spectrum measurements; Design automation; Equivalent circuits; Heterojunction bipolar transistors; Performance evaluation; Physics; Power measurement; Semiconductor diodes; Temperature; Thermal conductivity; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1012293
  • Filename
    1012293