• DocumentCode
    1844587
  • Title

    A History of Microwave Wafer Probing

  • Author

    Strid, Eric

  • Author_Institution
    Cascade Microtech, Inc., eric@cmicro.com
  • Volume
    32
  • fYear
    1997
  • fDate
    4-5 Dec. 1997
  • Firstpage
    27
  • Lastpage
    34
  • Abstract
    A series of slides and pictures display the technological history of microwave wafer probing.
  • Keywords
    Biomembranes; Chip scale packaging; Digital integrated circuits; History; Integrated circuit layout; Integrated circuit testing; Microelectronics; Plastic integrated circuit packaging; Probes; Production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 50th
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1997.327248
  • Filename
    4119935
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1844587