Title :
Series-Resistor Calibration
Author :
Williams, Dylan F. ; Walker, David K.
Author_Institution :
National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303
Abstract :
We develop a coplanar-waveguide probe-tip scattering parameter calibration based on a thru, a reflect, and an accurately modeled series resistor. Comparison to a multiline Thru-Reflect-Line calibration verifies the accuracy of the method.
Keywords :
Calibration; Circuits; Coplanar waveguides; Impedance; Measurement standards; NIST; Reflection; Resistors; Standards publication; Transmission line matrix methods;
Conference_Titel :
ARFTG Conference Digest-Fall, 50th
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1997.327267
