Title :
A High Throughput On-Wafer RFIC Tester
Author :
Kerwin, K.J. ; Bugely, E.L. ; Chavez, R. ; Marroquin, J. ; Laurell, R. ; Veteran, D. ; Olney, D. ; McGinty, D. ; Madonna, G.L.
Author_Institution :
Hewlett-Packard Company, Santa Rosa, CA
Abstract :
Volume RFIC production requirements are driving industry to seek higher throughput lower cost on-wafer comprehensive dc and RF test capability than can be implemented using traditional ¿rack and stack¿ test systems. To meet RFIC volume test demands, an in-house on-wafer test system based upon HP¿s 84000 RFIC tester was designed and implemented. With the resulting system a 23X on-wafer test throughput improvement has been achieved over a prior test system implementation.
Keywords :
Assembly; Costs; Economic forecasting; Environmental economics; Multichip modules; Packaging; Radio frequency; Radiofrequency integrated circuits; System testing; Throughput;
Conference_Titel :
ARFTG Conference Digest-Fall, 50th
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1997.327269
