• DocumentCode
    1844977
  • Title

    Application of probability distribution to the measurements of partial discharges deriving from tree-growth tests

  • Author

    Bozzo, R. ; Contin, A. ; Guastavino, F. ; Montanari, G.C.

  • Author_Institution
    Dipartimento di Ingegneria Elettrica, Genoa Univ., Italy
  • fYear
    1994
  • fDate
    23-26 Oct 1994
  • Firstpage
    112
  • Lastpage
    117
  • Abstract
    Statistical tools are applied to the results of partial discharge measurements performed by means of a digital system, with the purpose to identify parameters useful for pattern recognition. In particular, the probability distribution of the charge height is investigated resorting to the two-parameter Weibull function. The PD data obtained from measurements of tree growth in specimens of EVA copolymer subjected to constant voltage, at room temperature, are considered. Two configurations of the point-plane electrode geometry are tested, which differ for the presence or not of an artificial void at the needle tip. It is shown that the probability distribution of the PD-pulse height is well described by the two parameter Weibull function when tree grows in the insulation, in the absence of the artificial void, or PDs are occurring in the void, before inception of tree in the insulation. The Weibull parameters are related to tree-growth features and are sensitive to transition of tree from void to insulation
  • Keywords
    probability; EVA copolymer; artificial void; charge height; digital system; partial discharges; pattern recognition; point-plane electrode geometry; probability distribution; tree-growth tests; two-parameter Weibull function; Digital systems; Electrodes; Partial discharge measurement; Partial discharges; Pattern recognition; Performance evaluation; Probability distribution; Temperature; Trees - insulation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    0-7803-1950-8
  • Type

    conf

  • DOI
    10.1109/CEIDP.1994.591721
  • Filename
    591721