• DocumentCode
    1845145
  • Title

    Statistical image modeling using von Mises distribution in the complex directional wavelet domain

  • Author

    Vo, An P N ; Oraintara, Soontorn ; Nguyen, Truong T.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Texas at Arlington, Arlington, TX
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    2885
  • Lastpage
    2888
  • Abstract
    In this paper, a new statistical model is proposed for modeling the nature images in the transform domain. We demonstrate that the von Mises distribution (VM) fits accurately the behaviors of relative phases in the complex directional wavelet subband from different nature images. Moreover, a new image feature based on the VM model is proposed for texture image retrieval application. The VM based feature yields higher retrieval accuracy compared to the energy features and the relative phase features. In addition to magnitude information typically used in many other feature extraction methods, the VM based phase information is also incorporated to further improve the performance.
  • Keywords
    image processing; statistics; wavelet transforms; directional wavelet domain; nature images; statistical image modeling; von Mises distribution; Feature extraction; Geophysics; Hidden Markov models; Image processing; Image retrieval; Statistical distributions; Virtual manufacturing; Wavelet coefficients; Wavelet domain; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4542060
  • Filename
    4542060