Title :
Analysis of electric field distribution in cavities within solid dielectric materials
Author :
Ghourab, M.E. ; El-Makkawy, S.M.
Author_Institution :
Dept. of Electr. Eng., Suez-Canal Univ., Port-Said, Egypt
Abstract :
In this paper, the charge simulation method (CSM) is used to calculate the maximum field stress and the electric field distribution within spherical voids embedded within a solid dielectric material. The effect of number and size of voids, electrode spacing, permittivity and void orientation on the electric field is studied as well
Keywords :
voids (solid); cavities; charge simulation method; electric field distribution; field stress; solid dielectric materials; spherical voids; Boundary conditions; Computational modeling; Design engineering; Dielectric materials; Dielectrics and electrical insulation; Equations; Gases; Solids; Stress; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.591735
