The thermal-step-technique applied to the study of charge in an ordered structure material: single-crystal quartz

Author

Agnel, S. ; Toureille, A.

Author_Institution

Lab. d´´Electron. de Montpellier, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

fYear

1994

fDate

23-26 Oct 1994

Firstpage

177

Lastpage

182

Abstract

The interest of this study concerns the physics of space charge, In fact, a lot of electrical phenomena (dielectric rigidity, conduction, stocking of charges), mechanical phenomena (mechanical breakdown, grain boundaries), thermal phenomena (specific heat, diffusivity, conduction) seem to be linked to the space charge presence in these materials. In this article, after recalling the principle of space charge measurement elaborated and used in the Electrotechnics Laboratory of Montpellier, we discuss measurement results obtained on single-crystal quartz samples using the thermal-step method

Keywords

quartz; SiO₂; dielectric rigidity; mechanical phenomena; residual electric field; single-crystal quartz; space charge density; space charge measurement; thermal expansion current; thermal phenomena; thermal-step method; Charge measurement; Conducting materials; Current measurement; Dielectric breakdown; Grain boundaries; Physics; Resistance heating; Space charge; Space heating; Thermal conductivity;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on

Conference_Location

Arlington, TX

Print_ISBN

0-7803-1950-8

Type

conf

DOI

10.1109/CEIDP.1994.591738

Filename

591738