DocumentCode :
1845541
Title :
The low energy crossover point for secondary electron emission from Lexan
Author :
Hatfield, Lynn L. ; Adamson, Elise R.
Author_Institution :
Dept. of Phys., Texas Tech. Univ., Lubbock, TX, USA
fYear :
1994
fDate :
23-26 Oct 1994
Firstpage :
256
Lastpage :
261
Abstract :
The lowest primary electron energy for which the secondary electron emission coefficient is equal to one is referred to as the low energy crossover point. Previous measurements for a number of common polymers have indicated that this crossover point occurs between 30 eV and 60 eV depending on the particular polymer. This means that a small amount of charge on the surface of the sample can produce a surface potential which can be a significant fraction of the crossover point energy. The method of measurement used in our work assumes that the sample is initially uncharged and the surface potential is calculated from the integral over time of the replacement current. If the sample has an initial charge this method will predict the wrong crossover point energy. Our measurements show initial surface potentials ranging from 10 to 500 volts depending on the sample preparation technique. In addition, the surface potential is non uniform and may even alternate in polarity on adjacent regions of the surface. The secondary emission data collected on a number of identically prepared samples exhibit a random scatter due to this residual charge which causes a ±25% uncertainty in the average of the measured crossover point energy
Keywords :
organic insulating materials; 10 to 500 V; 30 to 60 eV; Lexan; low energy crossover point; polarity; polymers; replacement current; sample preparation; secondary electron emission; surface charge; surface potential; Charge measurement; Conducting materials; Current measurement; Electron emission; Particle measurements; Physics; Plastic insulation; Polymers; Scattering; Solids;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
Type :
conf
DOI :
10.1109/CEIDP.1994.591751
Filename :
591751
Link To Document :
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