Title :
Space charge characterization by the pressure pulse method in ion-irradiated polyimide films
Author :
Cals, M.P. ; Costantini, J.M. ; Issac, F. ; Marque, J.P.
Author_Institution :
Office Nat. d´´Etudes et de Recherches Aerospatiales, Chatillon, France
Abstract :
The Pressure Pulse Method allows in situ measurements of charge build-up and evolution in heavy ion irradiated Kapton samples with a good signal to noise ratio. Space charge is detected in films with a thickness to range ratio larger or lower than one; in the latter case, ions are crossing throughout the material but a residual charge can be detected. The mean projected range in a thick sample, <rp>, is determined with good accuracy at low fluence
Keywords :
polymer films; 12.5 mum; 25 mum; Kapton; charge build-up; charge profile measurement; heavy ion irradiation; in situ measurement; mean projected range; polyimide films; pressure pulse method; residual charge; signal to noise ratio; space charge detection; thickness to range ratio; Charge measurement; Conductivity; Copper; Current measurement; Electrodes; Insulation; Polyimides; Polymer films; Pulse measurements; Space charge;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.591755
