Title :
Diagnostic of High Speed Analog Circuits using DC conditions
Author :
C. A., Gracios Marin ; L.A., Sarmiento Reyes
Author_Institution :
I.T.V. - I.N.A.O.E., Puebla. Pue. MEXICO, cgracios@inaoep.mx
Abstract :
This paper focusses the attention on the problem of analog nonlinear circuits diagnostic when a circuit with multiple DC solutions has a fault in any element and the possibility to locate the fault in the circuit is complicated due to change in the number of solutions. Several improvements are tried to include in [1] with the gain to use differents models in the electronic devices like diodes, bipolar or MOS transistors and it let to observe how the analysis changes when the designer uses a simple model
Keywords :
Analog circuits; Circuit faults; Circuit testing; Diodes; Electronic equipment testing; Equations; High-speed electronics; MOSFETs; Nonlinear circuits; Stress;
Conference_Titel :
ARFTG Conference Digest-Fall, 52nd
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1998.327315
