Title : 
CMOS temperature sensor with ring oscillator for mobile DRAM self-refresh control
         
        
            Author : 
Kim, Chan Kyung ; Kong, Bai Sun ; Lee, Chil Gee ; Jun, Young Hyun
         
        
            Author_Institution : 
Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon
         
        
        
        
        
        
            Abstract : 
This paper presents novel low-cost CMOS temperature sensor for controlling the self-refresh period of a mobile DRAM. In the proposed temperature sensor, the temperature dependency of poly resistance is used to generate a temperature-dependent bias current, and a ring oscillator driven by this bias current is employed to obtain the digital code pertaining to on-chip temperature. This method is highly area- efficient, simple and easy for IC implementation as compared to traditional temperature sensors based on bandgap reference. The proposed CMOS temperature sensor was fabricated with an 80 nm 3-metal DRAM process, which occupies extremely small silicon area of only about 0.016 m with under 1uW power consumption for providing 0.7degC effective resolution at 1 sample/sec processing rate. This result indicates that as much as 73% area reduction was obtained with improved resolution as compared to the conventional temperature sensor in mobile DRAM.
         
        
            Keywords : 
CMOS integrated circuits; DRAM chips; oscillators; temperature sensors; CMOS temperature sensor; bandgap reference; mobile DRAM self-refresh control; poly resistance; ring oscillator; temperature-dependent bias current; Communication system control; Energy consumption; Frequency; Random access memory; Ring oscillators; Signal generators; Temperature control; Temperature dependence; Temperature measurement; Temperature sensors;
         
        
        
        
            Conference_Titel : 
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
         
        
            Conference_Location : 
Seattle, WA
         
        
            Print_ISBN : 
978-1-4244-1683-7
         
        
            Electronic_ISBN : 
978-1-4244-1684-4
         
        
        
            DOI : 
10.1109/ISCAS.2008.4542112