DocumentCode :
1846170
Title :
Extending Microarray Quality Control and Analysis Algorithms to Illumina Chip Platform
Author :
Stokes, T.H. ; Xiao Han ; Moffitt, R.A. ; Wang, M.D.
Author_Institution :
Georgia Inst. of Technol., Atlanta
fYear :
2007
fDate :
22-26 Aug. 2007
Firstpage :
4637
Lastpage :
4640
Abstract :
This paper presents a novel data quality control technique for a challenging new microarray platform supplied by Illumina, Inc. Microarray is a revolutionary biotechnology that enables the study of thousands of genes and proteins simultaneously. While the type of microarray chip platforms keeps increasing and the manufacture quality keeps improving, the array data quality control and analysis tools are still lagging behind. In this research, we design an adaptable microarray data quality control and analysis system capable of handling multiple microarray platforms. We demonstrate that the Illumina chips, even though the layouts are randomly assembled, still contain artifacts. We conclude that it is necessary for chip manufacturers to provide low-level bead location output as a standard feature for better data quality assurance.
Keywords :
biochemistry; biology computing; biotechnology; data analysis; genetics; lab-on-a-chip; molecular biophysics; proteins; Illumina chip platform; genes; microarray analysis algorithms; microarray quality control; proteins; revolutionary biotechnology; Algorithm design and analysis; Biomedical computing; Biomedical engineering; Control system analysis; Manufacturing; Probes; Quality assurance; Quality control; Reproducibility of results; Testing; Artifact Removal; Illumina Microarray; Quality Control; Computer Simulation; Gene Expression Profiling; Gene Expression Regulation; Oligonucleotide Array Sequence Analysis; Random Allocation; Selection Bias; Sensitivity and Specificity; Software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
ISSN :
1557-170X
Print_ISBN :
978-1-4244-0787-3
Type :
conf
DOI :
10.1109/IEMBS.2007.4353373
Filename :
4353373
Link To Document :
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