DocumentCode
1846240
Title
Integrating System Level Design and Instrumentation for Communications Development
Author
Palmer, Frank
Author_Institution
Hewlett Packard, Microwave Instrument Division, 1400 Fountain Grove Parkway, Santa Rosa, CA95403
Volume
34
fYear
1998
fDate
Dec. 1998
Firstpage
140
Lastpage
156
Abstract
A challenge for communication system designers is to integrate many hardware subsystems. After a system has been modeled in software it has to be transferred to a hardware prototype. Linking electronic design automation (EDA) tools with measurement equipment decreases the time needed to evaluate and troubleshoot the system. This is accomplished by allowing subsystems to be tested as if they were part of the entire system even before the entire system is transferred to a hardware prototype. In this paper we¿ll describe this software/hardware link between the EDA tools and measurement equipment using the HP W-CDMA design library, HP 89441A vector signal analyzer and HP ESG-D RF digital signal generator. In doing this we¿ll also be able to describe this solution¿s application as a flexible waveform generator. A wide variety of signals can be simulated using HP Advanced Design System (ADS) and the HP W-CDMA design library, with this software/hardware link these signals can now be turned into real world signals generated by the HP ESG-D RF digital signal generator. This includes baseband signals, RF signals, and also signals with channel impairments such as, fading, phase noise, IQ gain imbalance, and amplifier non-linearities. The key benefit of linking the EDA tools with test equipment is the reduced time to market for your products. We have discussed each of the three ways listed above in which you can reduce product cycle times.
Keywords
Electronic design automation and methodology; Hardware; Instruments; Joining processes; Multiaccess communication; RF signals; Signal design; Signal generators; Software prototyping; System-level design;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Fall, 52nd
Conference_Location
Rohnert Park, CA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1998.327326
Filename
4120011
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