Title :
Measurements and Nonlinear Modeling
Author_Institution :
Nonlinear Technologies, Inc., PO Box 7284, Long Beach, CA 90807 USA
Abstract :
This paper examines some issues at the interface between nonlinear circuit analysis and RF/microwave measurements. We examine methods of nonlinear circuit analysis and device modeling, consider how device measurements affect accuracy of analysis, and identify areas where the process could be enhanced.
Keywords :
Circuit analysis; Circuit simulation; Harmonic analysis; Microwave devices; Microwave measurements; Nonlinear circuits; Radio frequency; SPICE; Transient analysis; Voltage;
Conference_Titel :
ARFTG Conference Digest-Spring, 53rd
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1999.327327
