Title :
Proposed chapter 9 for predicting voltage sags (dips) in revision to IEEE Std 493, the Gold Book
Author :
Becker, Carl ; Braun, William, Jr. ; Carrick, Kenneth ; Diliberti, Tom ; Grigg, Cliff ; Groesch, Joe ; Hazen, Bill ; Imel, Tom ; Koval, Don ; MUELLER, David ; John, Tony Saint ; Conrad, Larry E.
Abstract :
Voltage sags, also known as dips, are increasingly important to industrial reliability. Modern process controls are often sensitive to voltage sags. The combination of a voltage sag and sensitive equipment may cause significant production outages. Less sensitive equipment may be available at a premium price, but the designer must know the sag characteristics of the electric system to make the best choices between reliability and cost. This proposed chapter offers a way to predict voltage sag performance without long term monitoring and before plants are constructed. The analysis technique proposed for a new chapter 9 in the next revision of IEEE std 493 is shown.<>
Keywords :
electrical faults; power system reliability; standards; Gold Book; IEEE Std 493; electric system; fault clearing; industrial reliability; proposed chapter 9; voltage dips; voltage sags prediction; Books; Circuit analysis computing; Circuit faults; Electronics packaging; Gold; Power quality; Power system reliability; Production; Substations; Voltage fluctuations;
Conference_Titel :
Industrial and Commercial Power Systems Technical Conference, 1993. Conference Record, Papers Presented at the 1993 Annual Meeting
Conference_Location :
St. Petersburg, FL, USA
Print_ISBN :
0-7803-0937-5
DOI :
10.1109/ICPS.1993.290589