DocumentCode
1846717
Title
Radar target recognition based on orthogonal range profile extraction
Author
Hai Deng
Author_Institution
Dept. of Electr. Eng., New Orleans Univ., LA, USA
Volume
3
fYear
2003
fDate
22-27 June 2003
Firstpage
163
Abstract
In this paper a novel approach to use orthogonal range profiles for effective real-time target recognition is proposed. The proposed system is based on the two netted monostatic radars located at different locations. The two radars simultaneously send two different specially designed wideband radar waveforms to generate a pair of orthogonal range profiles of the target from different incident angles at the same moment. The two-dimensional target scattering feature is thus extracted from the two orthogonal range profiles for efficient target recognition. The wideband waveforms used by the two radars are designed such that they do not correlate to each other, i.e. their cross-correlation function is almost zero, and each of them has thumbtack-like autocorrelation function. Therefore, the matched filter at the receiver of one of the radars outputs a strong processing result only with the input including the coding waveform transmitted by the same radar; while the target echo scattered from the waveform transmitted by the other radar is mismatched at the receiver and behaves like a noise signal.
Keywords
matched filters; military radar; radar cross-sections; radar resolution; radar target recognition; antenna pattern; autocorrelation function; ballistic missile defense; high-resolution range profiles; matched filter; netted monostatic radars; orthogonal range profile extraction; radar target recognition; real-time target recognition; target tracking; two-dimensional target scattering feature; wideband radar waveforms; Airborne radar; Autocorrelation; Matched filters; Missiles; Radar imaging; Radar scattering; Radar signal processing; Signal design; Synthetic aperture radar; Target recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location
Columbus, OH, USA
Print_ISBN
0-7803-7846-6
Type
conf
DOI
10.1109/APS.2003.1219814
Filename
1219814
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