DocumentCode :
1846757
Title :
Effect of the thermostatic expansion valve characteristics on the stability of a refrigeration system-Part I
Author :
Kulkarni, Amit ; Mulay, Veerendra ; Agonafer, Dereje ; Schmidt, Roger
Author_Institution :
Mech. & Aerosp. Eng. Dept., Texas Univ., Arlington, TX, USA
fYear :
2002
fDate :
2002
Firstpage :
403
Lastpage :
407
Abstract :
The combination of increased power dissipation and increased packaging density has led to substantial increases in chip and module heat flux in high-end computers. The challenge has been to limit the rise in chip temperature. In the past virtually all-commercial computers were designed to operate at temperatures above the ambient. However researchers have identified the advantages of operating electronics at low temperatures. The current research focuses on IBM´s S/390 mainframe, which uses a conventional refrigeration system to maintain chip temperatures below that of comparable air-cooled systems, but well above cryogenic temperatures. Attention will be to investigate the characteristics of the thermostatic expansion valve, specifically, the effect of variation of evaporator outlet superheat on the flow through the TXV at varying evaporator temperature, and the effect of sudden changes in evaporator heat load and condenser pressure variation on the temperature oscillations at the evaporator. The paper also discusses the effect of changes in the thermostatic bulb location and bulb time constant on the hunting phenomena at the evaporator.
Keywords :
IBM computers; chip scale packaging; cooling; mainframes; refrigeration; stability; thermal management (packaging); thermal resistance; CMOS chip; IBM S/390 mainframe; bulb time constant; chip temperatures; condenser pressure variation; evaporator superheat; high-end computers; mathematical model; module heat flux; packaging density; power dissipation; refrigeration; stability; temperature oscillations; thermostatic bulb location; thermostatic expansion valve; CMOS technology; Charge carrier processes; Cooling; Electron mobility; Logic testing; Packaging; Refrigeration; Temperature distribution; Thermal stability; Valves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2002. ITHERM 2002. The Eighth Intersociety Conference on
ISSN :
1089-9870
Print_ISBN :
0-7803-7152-6
Type :
conf
DOI :
10.1109/ITHERM.2002.1012484
Filename :
1012484
Link To Document :
بازگشت