Title : 
Asynchronous balanced gates tolerant to interconnect variability
         
        
            Author : 
Kulikowski, Konrad J. ; Venkataraman, Vyas ; Wang, Zhen ; Taubin, Alexander ; Karpovsky, Mark
         
        
            Author_Institution : 
Reliable Comput. Lab., Boston Univ., Boston, MA
         
        
        
        
        
        
            Abstract : 
Existing methods for gate level power attack countermeasures depend on exact capacitance matching of the dual-rail data outputs of each gate. Process variability and a lack of design tools make this requirement very difficult to satisfy in practice. We present a novel asynchronous dual-rail gate design which is power balanced, does not require capacitance matching of the data outputs, and is tolerant to process variability on the routed interconnect between gates.
         
        
            Keywords : 
asynchronous circuits; capacitance; integrated circuit design; integrated circuit interconnections; asynchronous balanced gates; asynchronous dual-rail gate design; capacitance matching; gate level power attack countermeasures; interconnect variability; Capacitance;
         
        
        
        
            Conference_Titel : 
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
         
        
            Conference_Location : 
Seattle, WA
         
        
            Print_ISBN : 
978-1-4244-1683-7
         
        
            Electronic_ISBN : 
978-1-4244-1684-4
         
        
        
            DOI : 
10.1109/ISCAS.2008.4542136