• DocumentCode
    1846770
  • Title

    Asynchronous balanced gates tolerant to interconnect variability

  • Author

    Kulikowski, Konrad J. ; Venkataraman, Vyas ; Wang, Zhen ; Taubin, Alexander ; Karpovsky, Mark

  • Author_Institution
    Reliable Comput. Lab., Boston Univ., Boston, MA
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    3190
  • Lastpage
    3193
  • Abstract
    Existing methods for gate level power attack countermeasures depend on exact capacitance matching of the dual-rail data outputs of each gate. Process variability and a lack of design tools make this requirement very difficult to satisfy in practice. We present a novel asynchronous dual-rail gate design which is power balanced, does not require capacitance matching of the data outputs, and is tolerant to process variability on the routed interconnect between gates.
  • Keywords
    asynchronous circuits; capacitance; integrated circuit design; integrated circuit interconnections; asynchronous balanced gates; asynchronous dual-rail gate design; capacitance matching; gate level power attack countermeasures; interconnect variability; Capacitance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4542136
  • Filename
    4542136