DocumentCode
1846770
Title
Asynchronous balanced gates tolerant to interconnect variability
Author
Kulikowski, Konrad J. ; Venkataraman, Vyas ; Wang, Zhen ; Taubin, Alexander ; Karpovsky, Mark
Author_Institution
Reliable Comput. Lab., Boston Univ., Boston, MA
fYear
2008
fDate
18-21 May 2008
Firstpage
3190
Lastpage
3193
Abstract
Existing methods for gate level power attack countermeasures depend on exact capacitance matching of the dual-rail data outputs of each gate. Process variability and a lack of design tools make this requirement very difficult to satisfy in practice. We present a novel asynchronous dual-rail gate design which is power balanced, does not require capacitance matching of the data outputs, and is tolerant to process variability on the routed interconnect between gates.
Keywords
asynchronous circuits; capacitance; integrated circuit design; integrated circuit interconnections; asynchronous balanced gates; asynchronous dual-rail gate design; capacitance matching; gate level power attack countermeasures; interconnect variability; Capacitance;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4244-1683-7
Electronic_ISBN
978-1-4244-1684-4
Type
conf
DOI
10.1109/ISCAS.2008.4542136
Filename
4542136
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