• DocumentCode
    1846811
  • Title

    VNA Calset Port Augmentation for Impedance Matching Probe Calibration

  • Author

    Hayden, Leonard

  • Author_Institution
    Cascade Microtech, Inc., 2430 NW 206th Ave., Beaverton, OR 97060
  • Volume
    35
  • fYear
    1999
  • fDate
    36312
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A method for calibrating an on-wafer VNA measurement system with unequal port impedances determined by impedance matching probes is presented. The method starts with an existing stored calibration set for measurement reference planes at the ends of the coaxial cables. A new calibration set with a probe-tip reference plane is determined through a calibration set augmentation procedure using measured two-port normalized S-parameters of each probe.
  • Keywords
    Calibration; Circuits; Coaxial cables; Coaxial components; Impedance matching; Impedance measurement; Probes; Reflection; Scattering parameters; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 53rd
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1999.327345
  • Filename
    4120038
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1846811