• DocumentCode
    1846851
  • Title

    An algorithm for ARMA model parameter estimation from noisy observations

  • Author

    Fattah, S.A. ; Zhu, W.P. ; Ahmad, M.O.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    3202
  • Lastpage
    3205
  • Abstract
    This paper presents a new algorithm for the parameter estimation of minimum-phase autoregressive moving average (ARMA) systems from noise-corrupted observations. In order to estimate the AR parameters of the ARMA system, based on a repeated autocorrelation function (ACF) of the observed data, a set of zero lag compensated equations has been developed. For the estimation of the MA parameters, first, a noise-subtraction algorithm is proposed to reduce the effect of noise from the ACF of the residual signal which is obtained by filtering the noisy ARMA signal via the estimated AR parameters. The MA parameters are then estimated by using a spectral factorization corresponding to the noise-compensated ACF of the residual signal. Computer simulations are carried out for ARMA systems of different orders under noisy environments and simulation results demonstrate a superior identification performance in terms of estimation accuracy and consistency.
  • Keywords
    autoregressive moving average processes; parameter estimation; signal processing; ARMA model parameter estimation; ARMA systems; autocorrelation function; minimum-phase autoregressive moving average systems; noise-corrupted observations; noise-subtraction algorithm; noisy ARMA signal filtering; noisy observations; residual signal; spectral factorization; zero lag compensated equations; Autocorrelation; Autoregressive processes; Computer simulation; Equations; Filters; Noise reduction; Parameter estimation; Signal processing; Signal processing algorithms; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4542139
  • Filename
    4542139