DocumentCode
1846897
Title
Automating the Importation of Load Pull Data into a Non-Linear CAD Simulator
Author
Anderson, David
Author_Institution
Maury Microwave Corporation, 2900 Inland Empire Blvd, Ontario, CA 91764; Maury Microwave Corporation 2900 Inland Empire Blvd Ontario, CA 91764 Tele: 909-987-4715 Email: danderson@maurymw.com
Volume
35
fYear
1999
fDate
36312
Firstpage
1
Lastpage
6
Abstract
Microwave power amplifier design requires nonlinear device data across frequency range, bias levels and load impedance. Automatic load pull measurement systems can provide all of this device data and more. However, this considerable amount of device data must be imported into the design CAE tool manually. This manual data input requirement usually reduces the imported device data to a minimum. The minimum data leaves the amplifier designer with a lot of unanswered questions concerning the nonlinear device. These questions could be answered by importing additional device data until all data is imported into the CAE tool. This entire process could be improved by automatically importing all the device data into the CAE tool. All the load pull data taken across frequency range, bias levels and load impedance for the subject device would be imported into the CAE tool at one time. Once in the CAE tool the nonlinear device data serves as power amplifier design data. This paper describes the process of automatically importing all the measured device data into the CAE tool (The HP Advanced Design System is used as an example). Once in the CAE tool, the nonlinear device data serves as power amplifier design data, or can be used to verify a device model. This gives the designer much more flexibility, with confidence that the result represents actual, full power operation.
Keywords
Circuits; Computer aided engineering; Design automation; Impedance; Microwave devices; Microwave measurements; Power amplifiers; Power system harmonics; Radio frequency; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 53rd
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1999.327349
Filename
4120042
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