Title :
An approach for microprobe measurement and modeling for millimeter-wave application
Author :
Xiuping Li ; Jianjun Gao ; Choi Look Law ; Sheel Aditya
Author_Institution :
Nanyang Technol. Univ., Singapore, Singapore
Abstract :
This paper describes a simple method to check the performance of microprobe, since it will directly affect the accuracy of measurement results. The two-port S-parameters of the microprobe are determined by one-port S-parameters measurement using HP 8510XF Network Analyzer. Based on the measurement, an equivalent circuit model is given and good agreement between the measurement results and modeling results is obtained.
Keywords :
S-parameters; calibration; equivalent circuits; microwave reflectometry; millimetre wave measurement; network analysers; probes; waveguide transitions; calibration; coaxial-coplanar waveguide transition; equivalent circuit model; microprobe measurement; microprobe performance; millimeter-wave application; network analyzer; one-port S-parameters; two-port S-parameters; Calibration; Coaxial components; Coplanar waveguides; Frequency; Measurement standards; Millimeter wave measurements; Millimeter wave technology; Probes; Reflection; Scattering parameters;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
DOI :
10.1109/APS.2003.1219827
