Title :
Integral measurement system design using HP´s Advanced Design System
Author :
Valk, P. ; Tauritz, J.L.
Author_Institution :
Microwave Component Group, Delft Institute of Microelectronics and Submicron Technology (DIMES), Laboratory ECTM, Delft University of Technology, Feldmannweg 17,2628 CT Delft, The Netherlands Phone: +31-15-2784940, Fax: +31-15-2622163, E-mail: P.Valk@its.
Abstract :
The specification, realization and test of digital communication system components, presupposes an intimate knowledge of the impact of system demands on component requirements. This non-trivial task can be significantly simplified when simulation and measurement can be combined in a unified software package. An implementation strategy has been developed for introducing microwave instruments as models into Hewlett-Packard EEsof¿s Advanced Design System. One can configure a measurement system by dragging and dropping components on a design template. Using this implementation, measurements can be driven directly from ADS. In this paper we discuss the flexibility of this implementation with respect to Load-Pull measurements using a Maury Automatic Tuner System. This approach ensures flexibility in design and implementation of measurement systems and easy verification of simulations with measurements.
Keywords :
Analytical models; Circuit simulation; Instruments; Microwave measurements; Microwave technology; Signal generators; Software libraries; Software measurement; Software packages; Tuners;
Conference_Titel :
ARFTG Conference Digest-Spring, 54th
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1999.327378