DocumentCode
1847440
Title
Extraction of S-Parameters from TDR/TDT Measurements using Rational Functions
Author
Pannala, Sreemala ; Swaminathan, Madhavan
Author_Institution
Sun Microsystems, 901 San Antonio Road, MS SUN02-302, Palo Alto, CA 94303-4900 Phone: (408)616-5662 FAX: (408)774-2099, Email: sreemala.pannala@eng.sun.com
Volume
36
fYear
2000
fDate
Dec. 2000
Firstpage
1
Lastpage
8
Abstract
This paper discusses the extraction of broad band S-parameter response from transient reflection and transmission measurements. The method discussed uses the Generalized Pencil-of-Function method, recursive deconvolution and time referencing to develop models using rational functions. A low loss printed circuit board plane and a lossy thin film plane have been characterized using this method to extract the two-port S-parameters. These models are SPICE compatible and can be used to simulate the frequency or transient response. The results have been compared with network analyzer measurements to show the accuracy.
Keywords
Calibration; Data mining; Deconvolution; Electric variables measurement; Frequency domain analysis; Frequency measurement; Reflection; Scattering parameters; Time measurement; Transient response;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 54th
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1999.327362
Filename
4120064
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