DocumentCode
1847590
Title
The effect of load variations on on-wafer lumped element based calibrations
Author
Kirby, Pete ; Dunleavy, Lawrence ; Weller, Thomas
Author_Institution
University of South Florida, Wireless and Microwave (WAMI) Program, Tampa, Florida
Volume
36
fYear
2000
fDate
Dec. 2000
Firstpage
1
Lastpage
10
Abstract
We present a study of DC and RF measured variations in the resistance of loads that are to be used for on-wafer calibrations on GaAs substrates. The impact on measurement-based calibration definitions, and the calibration errors arising from neglecting the variations will be explored. Promising solutions for accommodating the variations into accurate on-wafer calibration strategies are advanced based on the use of the dc resistance of the load standard to aid in the calibration standard definition process.
Keywords
Calibration; Character generation; Coplanar waveguides; Electrical resistance measurement; Gallium arsenide; Load management; MMICs; Production; Resistors; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 54th
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1999.327368
Filename
4120070
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