• DocumentCode
    1847769
  • Title

    The effect of geometrical nonuniformity on electrical characteristics of ZnO varistors with Al2O3 dopant

  • Author

    Han, Se-Won ; Cho, Han-Goo

  • Author_Institution
    Korea Electrotechnol. Res. Inst., Changwon, South Korea
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    63
  • Lastpage
    66
  • Abstract
    The Al2O3 dopants affect the grain growth. The ZnO average grain size and standard deviation decrease with increasing Al2O3 content. The microstructure of ZnO varistor is more uniform with the increase of Al2O3 . Al2O3 dopant decreases the pore ratio by the spinning effect of of ZnAl2O4 spinel. The Al 2O3 dopants can effectively improve the voltage ratio and affect the electrical characteristics of ZnO varistors. The sample A2 with 0.005 wt.% Al2O3 content has a minimum voltage ratio and the best nonlinearity coefficient in high current region. Microstructure property has direct relations to breakdown voltage and nonlinearity coefficient. With the decrease of average grain size and standard deviation, the breakdown voltage and the nonlinearity coefficient increase. The complex analysis technique is used to characterize the AC response in heterogeneous microstructure system. The depressed angle in the complex impedance plane indicates nonideal (non-Debye or Cole-Cole) relaxation and is related to the degree of nonuniformity existing in barrier levels within each junctions
  • Keywords
    II-VI semiconductors; grain growth; grain size; semiconductor device breakdown; varistors; II VI semiconductors; ZnO:Al2O3; average grain size; breakdown voltage; electrical characteristics; geometrical nonuniformity; grain growth; nonideal relaxation; nonlinearity coefficient; pore ratio; spinning effect; varistors; voltage ratio; Aluminum oxide; Breakdown voltage; Doping; Electric variables; Grain size; Impedance; Microstructure; Spinning; Varistors; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
  • Conference_Location
    Kitchener, Ont.
  • Print_ISBN
    0-7803-7053-8
  • Type

    conf

  • DOI
    10.1109/CEIDP.2001.963489
  • Filename
    963489