DocumentCode :
1847773
Title :
Point sampling with uniformly distributed lines
Author :
Rovira, J. ; Wonka, P. ; Castro, F. ; Sbert, M.
Author_Institution :
Inst. d´´Informatica i Aplicacions, Univ. de Girona, Spain
fYear :
2005
fDate :
20-21 June 2005
Firstpage :
109
Lastpage :
118
Abstract :
In this paper we address the problem of extracting representative point samples from polygonal models. The goal of such a sampling algorithm is to find points that are evenly distributed. We propose star-discrepancy as a measure for sampling quality and propose new sampling methods based on global line distributions. We investigate several line generation algorithms including an efficient hardware-based sampling method. Our method contributes to the area of point-based graphics by extracting points that are more evenly distributed than by sampling with current algorithms.
Keywords :
computational geometry; feature extraction; image sampling; solid modelling; feature extraction; global line distribution; line generation algorithm; point sampling; polygonal model; realism; star-discrepancy; three-dimensional graphics; Carbon capture and storage; Computer graphics; Data structures; Hardware; Power generation; Rendering (computer graphics); Robustness; Sampling methods; Topology; Water storage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Point-Based Graphics, 2005. Eurographics/IEEE VGTC Symposium Proceedings
ISSN :
1511-7813
Print_ISBN :
3-905673-20-7
Type :
conf
DOI :
10.1109/PBG.2005.194071
Filename :
1500325
Link To Document :
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