DocumentCode :
1847885
Title :
Modeling and Detecting Deep Brain Activity with MEG & EEG
Author :
Attal, Y. ; Bhattacharjee, M. ; Yelnik, J. ; Cottereau, B. ; Lefevre, J. ; Okada, Y. ; Bardinet, E. ; Chupin, M. ; Baillet, S.
Author_Institution :
Univ. of Paris6, Paris
fYear :
2007
fDate :
22-26 Aug. 2007
Firstpage :
4937
Lastpage :
4940
Abstract :
We introduce an anatomical and electrophysiological model of deep brain structures dedicated to magnetoencephalography (MEG) and electroencephalography (EEG) source imaging. So far, most imaging inverse models considered that MEG/EEG surface signals were predominantly produced by cortical, hence superficial, neural currents. Here we question whether crucial deep brain structures such as the basal ganglia and the hippocampus may also contribute to distant, scalp MEG and EEG measurements. We first design a realistic anatomical and electrophysiological model of these structures and subsequently run Monte-Carlo experiments to evaluate the respective sensitivity of the MEG and EEG to signals from deeper origins. Results indicate that MEG/EEG may indeed localize these deeper generators, which is confirmed here from experimental MEG data reporting on the modulation of alpha brain waves.
Keywords :
Monte Carlo methods; bioelectric phenomena; brain models; electroencephalography; magnetoencephalography; neurophysiology; EEG; MEG; Monte-Carlo experiments; alpha brain waves; anatomical model; basal ganglia; brain structures; deep brain activity; electroencephalography; electrophysiological model; hippocampus; inverse models; magnetoencephalography; Anatomical structure; Anatomy; Basal ganglia; Brain modeling; Electroencephalography; Hippocampus; Image segmentation; Inverse problems; Magnetic resonance imaging; Scalp; Basal Ganglia; Brain; Electroencephalography; Electrophysiology; Hippocampus; Humans; Magnetoencephalography; Models, Biological; Models, Neurological; Visual Perception;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
ISSN :
1557-170X
Print_ISBN :
978-1-4244-0787-3
Type :
conf
DOI :
10.1109/IEMBS.2007.4353448
Filename :
4353448
Link To Document :
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