Title :
A hybrid self-testing methodology of processor cores
Author :
Lu, Tai-Hua ; Chen, Chung-Ho ; Lee, Kuen-Jong
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Abstract :
Software-based self-test (SBST) is a promising new technology for at-speed testing of embedded processors in SoC systems. This paper introduces an effective and efficient new SBST methodology that uses information abstracted from the processor instruction set architecture (ISA), pipeline architecture model, RTL descriptions, and gate-level net-list for test program development of different types of the processor circuitry. This paper demonstrates the feasibility of the proposed methodology by the achieved fault coverage on a complex pipeline processor core. Comparisons with previous work are also made. Experimental results show its potential as an effective method for practical use.
Keywords :
automatic test software; embedded systems; instruction sets; microprocessor chips; system-on-chip; at-speed testing; embedded processor cores; fault coverage; gate-level net-list; instruction set architecture; software-based self-test; system-on-chip; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Embedded computing; Microprocessors; Pipelines; Software testing; System testing; Test pattern generators;
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
DOI :
10.1109/ISCAS.2008.4542183