DocumentCode
1847938
Title
Measurement driven models of nonlinear electronic components
Author
Tufillaro, Nicholas ; Usikov, Daniel ; Barford, Lee ; Walker, David M. ; Schreurs, Dominique
Author_Institution
Agilent Techologies, Inc., 1501 Page Mill Road, MS 4A-D, Palo Alto, CA 94304 USA
Volume
37
fYear
2000
fDate
15-16 June 2000
Firstpage
1
Lastpage
8
Abstract
A modeling method that allows one to rapidly build data driven models for nonlinear components is discussed. The models are constructed from input/output time domain data and their "embeddings". The notion of models built from embeded data is described in the Taken\´s Embedding Theorem and has been extensively explored for modeling autonomous systems in the physics liteature. The authors extend these results to nonautonomous systems by creating tools that allow engineers to rapidly build models for driven nonlinear components. These models can be used in simulation, process control, diagonostics, and sensor calibration. We present the results of applying nonlinear modelling techniques to the modelling of measurements taken from a Nonlinear Network Measurement Systems (NNMS). A comparison is made between reconstructed polynomial models and radial basis models.
Keywords
Electronic components;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 55th
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.2000.327396
Filename
4120088
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