• DocumentCode
    1848122
  • Title

    Analytical formulation of the scattering by a slightly rough dielectric boundary, covered with a homogenous dielectric layer

  • Author

    Azadegan, R. ; Sarabandi, K.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    3
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    420
  • Abstract
    Characterization of the radar response of a multi-layer dielectric media with slightly rough interface has a number of applications, including remote sensing of snow non-destructive evaluation and quality control of multi-layered MMIC, etc. For the case of snow-pack remote sensing, the premise is to compare the scattered fields of the rough surface with snow with that on bare rough surface and then attribute the variation in the scattered power and coherence to the snow parameters. In this approach, first, the snow cover is modeled by a homogenous dielectric layer having a smooth top surface above a ground plane with a rough surface. In situations where the scattering from the rough surface become comparable to with the snow volumetric scattering, the volume scattering is added incoherently to the surface scattering, and then, the coherence is computed. In this paper, a small perturbation solution is developed to predict the bistatic scattering coefficients and the coherence of a slightly rough surface covered with homogenous dielectric layer.
  • Keywords
    backscatter; electromagnetic wave scattering; inhomogeneous media; perturbation techniques; radar cross-sections; remote sensing by radar; sensitivity analysis; backscattered coefficients; bistatic scattering coefficients; dielectric half-space; homogenous dielectric layer; radar response; sensitivity analysis; slightly rough dielectric boundary; small perturbation solution; snow-pack remote sensing; surface scattering; volumetric scattering; Coherence; Dielectrics; Radar applications; Radar remote sensing; Radar scattering; Remote sensing; Rough surfaces; Scattering parameters; Snow; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Conference_Location
    Columbus, OH, USA
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1219876
  • Filename
    1219876