Title :
Analysis of Interconnection Networks and Mismatch in the Nose-to-Nose Calibration
Author :
DeGroot, Donald C. ; Hale, Paul D. ; vanden Bossche, Marc ; Verbeyst, Frans ; Verspecht, Jan
Author_Institution :
National Institute of Standards and Technology, Radio-Frequency Technology Division, 325 Broadway, Boulder, CO 80303-3328 USA, Phone: 303-497-7212; Fax: 303-497-3970; E-mail degroot@nist.gov
Abstract :
We analyze the input networks of the samplers used in the nose-to-nose calibration method. Our model demonstrates that the required input network conditions are satisfied in this method and shows the interconnection errors are limited to measurement uncertainties of input reflection coefficients and adapter S-parameters utilized during the calibration procedure. Further, the input network model fully includes the effects of mismatch reflections, and we use the model to reconcile nose-to-nose waveform correction methods with traditional signal power measurement techniques.
Keywords :
Apertures; Calibration; Impedance; Multiprocessor interconnection networks; Oscilloscopes; Power measurement; Pulse generation; Reflection; Sampling methods; Transfer functions;
Conference_Titel :
ARFTG Conference Digest-Spring, 55th
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2000.327410