• DocumentCode
    1848343
  • Title

    Analysis of Interconnection Networks and Mismatch in the Nose-to-Nose Calibration

  • Author

    DeGroot, Donald C. ; Hale, Paul D. ; vanden Bossche, Marc ; Verbeyst, Frans ; Verspecht, Jan

  • Author_Institution
    National Institute of Standards and Technology, Radio-Frequency Technology Division, 325 Broadway, Boulder, CO 80303-3328 USA, Phone: 303-497-7212; Fax: 303-497-3970; E-mail degroot@nist.gov
  • Volume
    37
  • fYear
    2000
  • fDate
    15-16 June 2000
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We analyze the input networks of the samplers used in the nose-to-nose calibration method. Our model demonstrates that the required input network conditions are satisfied in this method and shows the interconnection errors are limited to measurement uncertainties of input reflection coefficients and adapter S-parameters utilized during the calibration procedure. Further, the input network model fully includes the effects of mismatch reflections, and we use the model to reconcile nose-to-nose waveform correction methods with traditional signal power measurement techniques.
  • Keywords
    Apertures; Calibration; Impedance; Multiprocessor interconnection networks; Oscilloscopes; Power measurement; Pulse generation; Reflection; Sampling methods; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 55th
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.2000.327410
  • Filename
    4120102