Title :
Comparison of calibrated S-parameters measured under CW and Pulsed RF excitation with a NonLinear Vectorial Network Analyzer
Author :
Vael, Philip ; Rolain, Yves
Author_Institution :
Dept. ELEC, Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussel, Belgium-Europe. Tel: +32 (2) 629 28 68, Fax: +32 (2) 629 28 50, email: philip.vael@vub.ac.be
Abstract :
A nonlinear pulsed rf network analysis setup is proposed based on the nonlinear vectorial network analyzer (NVNA) hardware. Using a phase coherent carrier-modulation setup, simultaneous measurement of carrier and envelope is possible. To show the measurement quality of the setup, a comparison is made between pulsed rf NVNA and continuous wave linear vectorial network analyzer (VNA) measurements of the S-parameters of a filter. Next, the nonlinear pulsed rf operation is illustrated on the pulsed measurement of an amplifier in the 900MHz range.
Keywords :
Microwave devices; Phase measurement; Power harmonic filters; Pulse amplifiers; Pulse measurements; Pulse modulation; Radio frequency; Scattering parameters; Signal generators; Testing;
Conference_Titel :
ARFTG Conference Digest-Spring, 55th
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2000.327414
