DocumentCode :
1848465
Title :
The application of TSC/TSL-United-Spectra in the investigation of electrical aging in polymer
Author :
Yi, Yin ; Demin, Tu ; Qinquan, Lei ; Xuan, Wang ; Kao, K.C.
Author_Institution :
Sch. of Electr. Power, Shanghai Jiao Tong Univ., China
fYear :
2001
fDate :
2001
Firstpage :
177
Lastpage :
182
Abstract :
In this paper thermal-simulated-current and thermal-simulated-luminescence combined spectra were used to investigate the variation of trap/combination centers and motion of molecular chains in polymer during the electrical aging process
Keywords :
ageing; electron traps; insulation testing; organic insulating materials; polymer structure; polymers; thermally stimulated currents; thermoluminescence; TSC/TSL spectra; electrical aging; electrical aging process; molecular chains; polymer; thermal-simulated-current; thermal-simulated-luminescence; trap/combination centers; Aging; Electrodes; Gold; Instruments; Luminescence; Materials science and technology; Polarization; Polyethylene; Polymers; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
Type :
conf
DOI :
10.1109/CEIDP.2001.963515
Filename :
963515
Link To Document :
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