Title :
Under-filled BGA solder joint vibration fatigue damage
Author :
Wong, T.E. ; Palmieri, F.W. ; Fenger, H.S.
Author_Institution :
Raytheon Electron. Syst., El Segundo, CA, USA
Abstract :
The paper (1) experimentally determines the survivability/durability of the solder joints of ball grid array (BGA) with/without under-filled materials when subjected to military vibration environment and (2) develops a vibration fatigue life prediction model, which is qualitatively calibrated by test. A test vehicle (TV), on which various sizes of BGA daisy-chained packages with/without under-filled materials, e.g., Hysol (non-reworkable) and Hacthane (reworkable) are soldered, is first designed, fabricated and subjected to random vibration tests continuously monitoring the solder joint integrity. Based on the measurement results, a destructive physical analysis is then conducted to further verify the failure locations and crack paths of the solder joints. Test results indicate that: (1) ceramic BGA (CBGA) mounted to the same modules will be more susceptible to failure than, the plastic BGA (PBGA) under the same conditions; (2) the PBGA solder joint fatigue life could be increased by one-order-of-magnitude (or more) using either one of under-filled materials in the packages versus using no underfilled material; (3) the use of under-filled material of Hysol could also improve the life expectancy of the CBGA by more than a factor of ten; and (4) only a slight increase in the life of the CBGA with using the under-filled material of Hacthane.
Keywords :
ball grid arrays; ceramic packaging; dynamic testing; encapsulation; failure analysis; fatigue; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; military equipment; plastic packaging; Hacthane; Hysol; ceramic BGA; crack paths; daisy-chained packages; destructive physical analysis; failure locations; life expectancy; life prediction model; military vibration environment; plastic BGA; random vibration tests; solder joint integrity; survivability/durability; test vehicle; under-filled BGA solder joint; vibration fatigue damage; Conducting materials; Electronics packaging; Fatigue; Joining materials; Life testing; Materials testing; Predictive models; Soldering; TV; Vehicles;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2002. ITHERM 2002. The Eighth Intersociety Conference on
Print_ISBN :
0-7803-7152-6
DOI :
10.1109/ITHERM.2002.1012560