• DocumentCode
    1848715
  • Title

    A New Technique for Low-Jitter Measurements Using Equivalent-Time Sampling Oscilloscopes

  • Author

    Nelson, Michael

  • Author_Institution
    Tektronix, Inc., Sampling Oscilloscopes, Beaverton, OR 97077 USA
  • Volume
    38
  • fYear
    2000
  • fDate
    Nov. 2000
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A new timebase technology for equivalent-time sampling oscilloscopes is presented. The technology is based on the qualification of a high-Q resonator with traditional analog signal processing, and provides a startable oscillator for generating trigger-to-strobe delays with excellent long term jitter performance.
  • Keywords
    Circuits; Degradation; Delay; Instruments; Jitter; Oscillators; Oscilloscopes; Sampling methods; Signal processing; Signal sampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 56th
  • Conference_Location
    Boulder, AZ, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.2000.327422
  • Filename
    4120121
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1848715