Title :
Electroluminescence based determination of the space charge limited field
Author :
Cao, Yang ; Boggs, Steven
Author_Institution :
Electr. Insulation Res. Center, Connecticut Univ., Storrs, CT, USA
Abstract :
Determination of the space charge limited field is compromised by photon detection sensitivity. As a result, the experimental determined field is affected by the test frequency and by the photomultiplier dark count. The electroluminescence inception field determined with semicon needle is in good agreement with the space charge limited field measured using a guarded needle electrode, while metal needles with tip radii smaller than 5 μm lead to much greater predicted space charge limited field due to the much smaller light emitting volume. This electrode size effect is explained, and a correction method is proposed which results in a more accurate determination of the space charge limited field from electroluminescence measurements
Keywords :
dielectric measurement; electroluminescence; insulation testing; space charge; 5 micron; correction method; electrode size effect; electroluminescence inception field; electroluminescence measurements; guarded needle electrode; metal needles; photomultiplier dark count; photon detection sensitivity; semiconductor needle; space charge limited field; test frequency; tip radii; Charge measurement; Current measurement; Electrodes; Electroluminescence; Frequency; Needles; Photomultipliers; Space charge; Testing; Volume measurement;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
DOI :
10.1109/CEIDP.2001.963528