DocumentCode
1848733
Title
Demonstrating reliability and reliability growth with environmental stress screening data
Author
Wong, Kam L.
Author_Institution
Kambea Eng., Manhattan Beach, CA, USA
fYear
1990
fDate
23-25 Jan 1990
Firstpage
47
Lastpage
52
Abstract
Problems with conventional reliability demonstration methods are addressed, and the conventional reliability-demonstration tests are compared with the environmental stress screening (ESS) method. The concept of the roller-coaster curve is reviewed. The aging process for electronics and the relative benefits of ESS and the roller-coaster curve are explored. Recommendations on implementing ESS for reliability demonstration and reliability assurance are provided
Keywords
electronic equipment testing; environmental testing; reliability; aging process; electronics; environmental stress screening; reliability growth; roller-coaster curve; Accelerated aging; Data engineering; Electronic equipment testing; Electronic switching systems; Extrapolation; Hazards; Meetings; Reliability engineering; Shape; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ARMS.1990.67929
Filename
67929
Link To Document