Title :
Demonstrating reliability and reliability growth with environmental stress screening data
Author_Institution :
Kambea Eng., Manhattan Beach, CA, USA
Abstract :
Problems with conventional reliability demonstration methods are addressed, and the conventional reliability-demonstration tests are compared with the environmental stress screening (ESS) method. The concept of the roller-coaster curve is reviewed. The aging process for electronics and the relative benefits of ESS and the roller-coaster curve are explored. Recommendations on implementing ESS for reliability demonstration and reliability assurance are provided
Keywords :
electronic equipment testing; environmental testing; reliability; aging process; electronics; environmental stress screening; reliability growth; roller-coaster curve; Accelerated aging; Data engineering; Electronic equipment testing; Electronic switching systems; Extrapolation; Hazards; Meetings; Reliability engineering; Shape; Stress;
Conference_Titel :
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location :
Los Angeles, CA
DOI :
10.1109/ARMS.1990.67929
